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- Authors:
- Heer, Michael; Dubec, Viktor; Blaho, Matej; Bychikhin, Sergey; Pogany, Dionýz; Gornik, Erich; Denison, Marie; Stecher, Matthias; Groos, Gerhard
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Automated setup for thermal imaging and electrical degradation study of power DMOS devices
- Title of conference publication:
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
- Subtitle of conference publication:
- Arcachon France: 10.10.2005 - 14.10.2005
- Conference title:
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (2005, Arcachon)
- Venue:
- Arcachon, France
- Year of conference:
- 2005
- Date of conference beginning:
- 10.10.2005
- Date of conference ending:
- 14.10.2005
- Year:
- 2005
- Language:
- Englisch
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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